The Everbeing EB-Series probe stations are designed for DC, RF, Fibre and mmWave probing. The heavier base offers a lower centre of gravity for improved stability and is supplied with a thicker platen to allow probe cards to be fitted.

The EB series is available in 4-12 inch (100-300mm) contains features to step-up your usability to acquire the accurate data you need from your devices.

Four models are available EB-4, EB-6, EB-8, EB-12 with optional Hot chuck, standard or enhanced coaxial or triaxial isolation for low noise measurements.

The EB series of probe staions from EverBeing offer high quality, precision probing solution for devices and full wafers. Available with 4, 6, 8 & 12 inch chucks, they can be used for many different applications, including device characterisation, failure analysis, design validation and wafer level reliability.

Features

• Coaxial-Driven Chuck Stage
• RF Probing Field Upgradable
• <p20X~4000X Magnification
• Backlash-Free Movement
• Choice Of Microscope (Tilt) Up/Down For E-Z Revolving Objectives

Optional Accessories

• RF Probe/Cables
• Active Probes
• Low Current/Capacitance Probes
• High Voltage Probes
• Laser Cutter
• Ultrasonic Cutter
• CCTV
• Photomicrographics
• Probe Card holder
• Packaged Device Holder
• PCB Holder
• Thermal Chuck
• Liquid Crystal Kit
• Vibration Free Table
• Shielding Box
• Test Bench
• Instrument Case With Caster
• Microscope Quick Lift
• Dark Field/Normarski Inspection
• Chuck Vacuum Pattern
• Gold Plated Chuck